The
system also offers very stable time-of-flight measurements at picosecond
resolution. These time measurements are useful in material analysis
applications to quantify very small changes in density or hardness by
tracking incremental changes in material sound velocity.
The sophisticated ScanView Plus system displays measurement data in
tabular format or a graphical matrix, or exports it to standard spreadsheet
packages. The resolution and accuracy of the TGM is significantly greater
than that found in conventional portable thickness gages.
The base TGM system includes a computer, digitizer card, customer-specified
pulser/receiver and ScanView Plus software. The TGM system also includes
an instrument setup menu for easy reconfiguration of multiple pulser/receivers.
Every system is custom tailored to your requirements.