System

System

Omniscan iX

The OmniScan® iX is an industrial ultrasonic flaw detector system designed for the high-speed testing of critical industrial components.  The compact OmniScan iX is housed in a rugged benchtop casing and is also available in a rack-mount version or with a swivel-arm assembly for easy integration into a production system. Typical applications include: Component testing Aerospace manufacturing, Automobile component testing, Welded components, and Integrated inspection systems.


ERW Tube Inspection

The R/D Tech phased-array technology: the solution for repeatability performance and oblique defect detection.

The R/D Tech full-body solution replaces the multiple-probe approach. Its unique, patented, inspection head allows this system to meet the new industry standards for the detection of longitudinal, transverse, and lamination defects as well as to perform wall thickness measurements. The same phased-array probe can detect multiple-orientation oblique defects without the need of additional mechanical systems. The R/D Tech approach using phased arrays offers the best solution to meet the industry's new stringent requirements in terms of repeatability performance.


Wire, Rod & Bar Inspection

This is the now standard R/D Tech solution for Schumag-type drawing machines. It offers a unique floating feature. The probe support is composed of two hinged-panel centering devices. Each centering device houses two rows of three rolls offering highly precise guidance. The hinged panels are attached to the probe support, which has two or three degrees of freedom, as required by the drawing line. This allows the probe to follow the movement of the material being tested for high sensitivity and repeatability. A simplified non-floating version is also available for small wires. Probe support is used to ensure proper centering.

Olympus NDT offers a solution for bended ends. One of the problems with drawing line inspections is the quick lash at the end of the wire coil, which can damage the eddy current probe. Olympus NDT has developed a removable EC array probe that opens to let the coil out.

The innovative advanced EC array technology offers unique capabilities for surface inspection of round, square, and hexagonal bars. The array coil configuration detects short and long defects. Very fast inspection speeds are achieved by using the powerful QuickScan™ EC instrument (40-kHz acquisition rate, 384 channels). Production line speeds can reach 2 m/s. Among other advantages, the system will detect an axially oriented, 5-mm long defect at a depth of 0.1 mm on a cold-drawn steel tube.

A high-quality inspection solution using phased-array technology allows for volume inspection and detection of small defects. The phased-array technique electronically rotates the ultrasound beam around the bar, eliminating the need for the mechanical rotation of the parts.


Plates

Our eddy current array inspection system advantageously replaces liquid penetrant in the inspection of flat surfaces, producing results much faster and without any chemical handling. Furthermore, results are stored on standard PC-based hardware and can be transferred in customized reports.

Also, array probes are a great alternative to the long dead zone, low sensitivity, and high maintenance level of the standard flat, rotating probe heads. Eddy current array probes are sized to cover a wide surface to lower the number of passes and, since there is no need for moving mechanical parts, the probes have a very high longevity and require little maintenance.


Semi Automatic Inspection System

We are capable of providing solutions to the customer with a combination of portable NDT instrument (such as eddy current, ECA, Phased Array, Thickness Gage), fixtures and automation as an inspection package in according to customer requirements.